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High Temperature EPMA in Combination with Depth Profiling and Scanning Techniques for Investigation pf WTi(N)-Cu Systems
Publication:
High Temperature EPMA in Combination with Depth Profiling and Scanning Techniques for Investigation pf WTi(N)-Cu Systems
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Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Möller, A.
;
Trenkler, Thomas
;
Wenzel, C.
;
Drescher, K.
Journal
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1981
since deposited on 2021-09-29
3
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1981
since deposited on 2021-09-29
3
last month
Acq. date: 2025-12-11
Citations