Publication:

Sn whisker evaluations in 3D microbumped structures

Date

2014
Journal article
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dc.contributor.authorVakanas, George
dc.contributor.authorVandecasteele, Bjorn
dc.contributor.authorSchaubroeck, David
dc.contributor.authorDe Messemaeker, Joke
dc.contributor.authorWillems, Geert
dc.contributor.authorAshworth, Mark A.
dc.contributor.authorWilcox, Geoffrey D.
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.imecauthorVandecasteele, Bjorn
dc.contributor.imecauthorSchaubroeck, David
dc.contributor.imecauthorDe Messemaeker, Joke
dc.contributor.imecauthorWillems, Geert
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecWillems, Geert::0000-0002-9137-618X
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.accessioned2021-10-22T06:54:27Z
dc.date.available2021-10-22T06:54:27Z
dc.date.issued2014
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24656
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0026271414003060
dc.source.beginpage1982
dc.source.endpage1987
dc.source.issue9_10
dc.source.journalMicroelectronics Reliability
dc.source.volume54
dc.title

Sn whisker evaluations in 3D microbumped structures

dc.typeJournal article
dspace.entity.typePublication
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