Publication:

Behavior of RF MEMS switches under ESD stress

Date

2010
Proceedings Paper
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dc.contributor.authorSangameswaran, Sandeep
dc.contributor.authorDe Coster, Jeroen
dc.contributor.authorCherman, Vladimir
dc.contributor.authorCzarnecki, Piotr
dc.contributor.authorLinten, Dimitri
dc.contributor.authorScholz, Mirko
dc.contributor.authorThijs, Steven
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.imecauthorDe Coster, Jeroen
dc.contributor.imecauthorCherman, Vladimir
dc.contributor.imecauthorCzarnecki, Piotr
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.accessioned2021-10-18T21:11:38Z
dc.date.available2021-10-18T21:11:38Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17934
dc.source.beginpage443
dc.source.conference32nd Annual EOS/ESD Symposium
dc.source.conferencedate3/10/2010
dc.source.conferencelocationReno, NV USA
dc.source.endpage449
dc.title

Behavior of RF MEMS switches under ESD stress

dc.typeProceedings paper
dspace.entity.typePublication
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