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Degradation of AlGaN/GaN HEMTs below the "critical voltage": a time-dependent analysis

Date

2012
Proceedings Paper
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dc.contributor.authorMeneghini, Matteo
dc.contributor.authorStocco, Antonio
dc.contributor.authorBertin, M
dc.contributor.authorMarcon, Denis
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.contributor.imecauthorMarcon, Denis
dc.date.accessioned2021-10-20T13:26:47Z
dc.date.available2021-10-20T13:26:47Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21134
dc.source.conferenceInternational Conference on Compound Semiconductor Manufacturing Technology - CSMantech
dc.source.conferencedate23/04/2012
dc.source.conferencelocationBoston, MA USA
dc.title

Degradation of AlGaN/GaN HEMTs below the "critical voltage": a time-dependent analysis

dc.typeProceedings paper
dspace.entity.typePublication
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