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Impact of advanced processing modules on the low-frequency noise performance of deep-submicron CMOS technologies
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Impact of advanced processing modules on the low-frequency noise performance of deep-submicron CMOS technologies
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Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Simoen, Eddy
Journal
Microelectronics Reliability
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1866
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations
Metrics
Views
1866
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations