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Sub-threshold study of undoped trigate nFinFET

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dc.contributor.authorTettamanzi, Giuseppe C.
dc.contributor.authorLansbergen, G.P.
dc.contributor.authorPaul, Abhijeet
dc.contributor.authorLee, S.
dc.contributor.authorDeosaran, P.A.
dc.contributor.authorCollaert, Nadine
dc.contributor.authorKlimeck, G.
dc.contributor.authorBiesemans, Serge
dc.contributor.authorRogge, Sven
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-18T22:16:23Z
dc.date.available2021-10-18T22:16:23Z
dc.date.issued2010
dc.identifier.issn0040-6090
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18077
dc.source.beginpage2521
dc.source.endpage2523
dc.source.issue9
dc.source.journalThin Solid Films
dc.source.volume518
dc.title

Sub-threshold study of undoped trigate nFinFET

dc.typeJournal article
dspace.entity.typePublication
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