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Scaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes
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1925 since deposited on 2021-10-22
Acq. date: 2026-02-24
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Views
1925 since deposited on 2021-10-22
Acq. date: 2026-02-24
Citations