Publication:
Scaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes
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1925 since deposited on 2021-10-22
2last week
Acq. date: 2025-10-29
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Metrics
Views
1925 since deposited on 2021-10-22
2last week
Acq. date: 2025-10-29
Citations