Electron transport response de-embedding for high-speed image sensors

dc.contributor.author	Chang, Yun Tzu
dc.contributor.author	Van Dorpe, Pol
dc.contributor.author	Van Hoof, Chris
dc.contributor.author	Suss, Andreas
dc.contributor.imecauthor	Chang, Yun Tzu
dc.contributor.imecauthor	Van Dorpe, Pol
dc.contributor.imecauthor	Van Hoof, Chris
dc.contributor.orcidimec	Van Dorpe, Pol::0000-0003-0918-1664
dc.contributor.orcidimec	Van Hoof, Chris::1234-1234-1234-1234
dc.date.accessioned	2021-10-27T07:57:58Z
dc.date.available	2021-10-27T07:57:58Z
dc.date.embargo	9999-12-31
dc.date.issued	2019
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/32686
dc.identifier.url	https://doi.org/10.1117/12.2518208
dc.source.beginpage	1098015
dc.source.conference	Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
dc.source.conferencedate	14/04/2019
dc.source.conferencelocation	Baltimore, MD USA
dc.title	Electron transport response de-embedding for high-speed image sensors
dc.type	Proceedings paper
dspace.entity.type	Publication
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