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Low-k integration: Gas screening for cryogenic etching and damage mitigation
Publication:
Low-k integration: Gas screening for cryogenic etching and damage mitigation
Date
2019
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chanson, Romain
;
Dussart, Remi
;
Tillocher, Thomas
;
Lefaucheux, Philippe
;
Dussarrat, Christian
;
de Marneffe, Jean-Francois
Journal
Frontiers of Chemical Science and Engineering
Abstract
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1986
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations
Metrics
Views
1986
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations