Publication:

Noise-margin analysis for organic thin-film complementary technology

Date

2010-01
Journal article
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dc.contributor.authorBode, Dieter
dc.contributor.authorRolin, Cedric
dc.contributor.authorSchols, Sarah
dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorSteudel, Soeren
dc.contributor.authorGelinck, Gerwin
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.contributor.imecauthorBode, Dieter
dc.contributor.imecauthorRolin, Cedric
dc.contributor.imecauthorSchols, Sarah
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.date.accessioned2021-10-18T15:22:19Z
dc.date.available2021-10-18T15:22:19Z
dc.date.issued2010-01
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16760
dc.identifier.urlhttp://ieeexplore.ieee.org/search/wrapper.jsp?arnumber=5340654
dc.source.beginpage201
dc.source.endpage208
dc.source.issue1
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume57
dc.title

Noise-margin analysis for organic thin-film complementary technology

dc.typeJournal article
dspace.entity.typePublication
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