Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Novell embedded microbump approach for die-to-die and wafer-to-wafer interconnects with variable microbump diameters and down to 5 μm interconnect pitch scaling
Publication:
Novell embedded microbump approach for die-to-die and wafer-to-wafer interconnects with variable microbump diameters and down to 5 μm interconnect pitch scaling
Copy permalink
Date
2019
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Derakhshandeh, Jaber
;
Beyne, Eric
;
Capuz, Giovanni
;
Inoue, Fumihiro
;
Cherman, Vladimir
;
De Preter, Inge
;
Duval, Fabrice
;
Slabbekoorn, John
;
Gerets, Carine
;
Heyvaert, Cindy
;
Beirnaert, Filip
;
Cochet, Tom
;
Bex, Pieter
;
Hou, Lin
;
Lofrano, Melina
;
Jamieson, Geraldine
;
Heylen, Nancy
;
Suhard, Samuel
;
Honore, Mia
;
Webers, Tomas
;
Rebibis, Kenneth June
;
Miller, Andy
;
Beyer, Gerald
Journal
Abstract
Description
Metrics
Views
2085
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
2085
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-11
Citations