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Characterization of etch residues generated on damascene structures
Publication:
Characterization of etch residues generated on damascene structures
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Le, Quoc Toan
;
Kesters, Els
;
Hoflijk, Ilse
;
Conard, Thierry
;
Shen, M.
;
Braun, S.
;
Burk, Y.
;
Holsteyns, Frank
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1892
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1892
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations