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Carbon-related defects in Si:C/silicon heterostructures assessed by deep-level transient spectroscopy
Publication:
Carbon-related defects in Si:C/silicon heterostructures assessed by deep-level transient spectroscopy
Date
2017
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Dhayalan, Sathish Kumar
;
Hikavyy, Andriy
;
Loo, Roger
;
Rosseel, Erik
;
Vrielinck, Henk
;
Lauwaert, Johan
Journal
ECS Journal of Solid State Science and Technology
Abstract
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1933
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations
Metrics
Views
1933
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations