Publication:
Characterization of (near) hermetic zero-level packages for MEMS
Date
| dc.contributor.author | De Moor, Piet | |
| dc.contributor.author | Baert, Kris | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.author | Jourdain, Anne | |
| dc.contributor.author | Tilmans, Harrie | |
| dc.contributor.author | Witvrouw, Ann | |
| dc.contributor.author | Van Hoof, Chris | |
| dc.contributor.imecauthor | De Moor, Piet | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.imecauthor | Jourdain, Anne | |
| dc.contributor.imecauthor | Tilmans, Harrie | |
| dc.contributor.imecauthor | Van Hoof, Chris | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.contributor.orcidimec | Tilmans, Harrie::0000-0003-4240-4962 | |
| dc.date.accessioned | 2021-10-16T01:09:31Z | |
| dc.date.available | 2021-10-16T01:09:31Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10309 | |
| dc.source.beginpage | 26 | |
| dc.source.conference | Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV | |
| dc.source.conferencedate | 24/01/2005 | |
| dc.source.conferencelocation | San Jose, CA USA | |
| dc.source.endpage | 35 | |
| dc.title | Characterization of (near) hermetic zero-level packages for MEMS | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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