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Lifetime test on EUV photomask with EBL2
Publication:
Lifetime test on EUV photomask with EBL2
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Chien-ching
;
Bender, Markus
;
Jonckheere, Rik
;
Scholze, Frank
;
Bekman, Herman
;
van Putten, Michel
;
de Zanger, Rory
;
Ebeling, Rob
;
Westerhout, Jeroen
;
Nicolai, Kyri
;
van Veldhoven, Jacqueline
;
de Rooij-Lohmann, Veronique
;
Kievit, Olaf
;
Deutz, Alex
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Acq. date: 2026-08-06
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Views
2107
since deposited on 2021-10-27
1
last month
Acq. date: 2026-08-06
Citations