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Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Publication:
Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Date
2015
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
Xu, Zheng
;
Paredis, Kristof
;
Schulze, Andreas
;
Vandervorst, Wilfried
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Abstract
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1854
since deposited on 2021-10-22
Acq. date: 2025-10-24
Citations
Metrics
Views
1854
since deposited on 2021-10-22
Acq. date: 2025-10-24
Citations