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Conference contributions
Characterization of boron-doped diamond films for application in nanoscale electrical measurements
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Characterization of boron-doped diamond films for application in nanoscale electrical measurements
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Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
Zimmer, Jerry
;
Moussa, Alain
;
Olanterae, Lauri
;
Clemente, Francesca
;
Geypen, Jef
;
Bender, Hugo
;
Vandervorst, Wilfried
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1886
since deposited on 2021-10-18
Acq. date: 2025-12-13
Citations
Metrics
Views
1886
since deposited on 2021-10-18
Acq. date: 2025-12-13
Citations