Oxide and interface degradation and breakdown under medium and high field injection conditions: a correlation study

dc.contributor.author	Degraeve, Robin
dc.contributor.author	Groeseneken, Guido
dc.contributor.author	De Wolf, Ingrid
dc.contributor.author	Maes, Herman
dc.contributor.imecauthor	Degraeve, Robin
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.imecauthor	De Wolf, Ingrid
dc.date.accessioned	2021-09-29T13:05:35Z
dc.date.available	2021-09-29T13:05:35Z
dc.date.embargo	9999-12-31
dc.date.issued	1995
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/616
dc.source.beginpage	313
dc.source.endpage	16
dc.source.issue	1_4
dc.source.journal	Microelectronic Engineering
dc.source.volume	28
dc.title	Oxide and interface degradation and breakdown under medium and high field injection conditions: a correlation study
dc.type	Journal article
dspace.entity.type	Publication
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