Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Gate reliability of p-GaN HEMT with gate metal retraction
Publication:
Gate reliability of p-GaN HEMT with gate metal retraction
Date
2019
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tallarico, Andrea
;
Stoffels, Steve
;
Posthuma, Niels
;
Bakeroot, Benoit
;
Decoutere, Stefaan
;
Sangiorgi, E
;
Fiegna, C
Journal
IEEE Transactions on Electron Devices
Abstract
Description
Metrics
Views
1923
since deposited on 2021-10-27
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1923
since deposited on 2021-10-27
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations