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Definition of dielectric breakdown for ultra thin (<2nm) gate oxides
Publication:
Definition of dielectric breakdown for ultra thin (<2nm) gate oxides
Date
1997
Journal article
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1826.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Depas, Michel
;
Nigam, Tanya
;
Heyns, Marc
Journal
Solid-State Electronics
Abstract
Description
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1954
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1954
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations