Publication:

Definition of dielectric breakdown for ultra thin (<2nm) gate oxides

Date

Loading...
Thumbnail Image

Journal

Abstract

Description

Metrics

Views

1954 since deposited on 2021-09-30
Acq. date: 2025-10-23

Citations

Metrics

Views

1954 since deposited on 2021-09-30
Acq. date: 2025-10-23

Citations