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Metrology of Thin Resist for High NA EUVL
Publication:
Metrology of Thin Resist for High NA EUVL
Date
2022
Proceedings Paper
https://doi.org/10.1117/12.2614046
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lorusso, Gian
;
Beral, Christophe
;
Bogdanowicz, Janusz
;
De Simone, Danilo
;
Hasan, Mahmudul
;
Jehoul, Christiane
;
Moussa, Alain
;
Saib, Mohamed
;
Zidan, Mohamed
;
Severi, Joren
;
Truffert, Vincent
;
Van Den Heuvel, Dieter
;
Goldenshtein, Alex
;
Houchens, Kevin
;
Santoro, Gaetano
;
Fischer, Daniel
;
Muellender, Angelika
;
Hung, Joey
;
Koret, Roy
;
Turovets, Igor
;
Ausschnitte, Kit
;
Mack, Chris
;
Kondo, Tsuyoshi
;
Shohjoh, Tomoyasu
;
Ikota, Masami
;
Charley, Anne-Laure
;
Leray, Philippe
Journal
Proceedings of SPIE
Abstract
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1424
since deposited on 2022-09-08
Acq. date: 2025-10-23
Citations
Metrics
Views
1424
since deposited on 2022-09-08
Acq. date: 2025-10-23
Citations