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A single pulse charge pumping technique for fast measurements of interface states
Publication:
A single pulse charge pumping technique for fast measurements of interface states
Date
2011
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lin, L.
;
Ji, Zhigang
;
Zhang, Jian Fu
;
Zhang, Wei Dong
;
Kaczer, Ben
;
De Gendt, Stefan
;
Groeseneken, Guido
Journal
IEEE Transactions on Electron Devices
Abstract
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1951
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1951
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations