A single pulse charge pumping technique for fast measurements of interface states

Publication:

2011

Journal article

Author(s)

Lin, L.

;

Ji, Zhigang

;

Zhang, Jian Fu

;

Zhang, Wei Dong

;

;

;

IEEE Transactions on Electron Devices

1954 since deposited on 2021-10-19

Acq. date: 2026-06-09