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Experimental verification of source-mask optimization and freeform illumination for 22 nm node SRAM cells
Publication:
Experimental verification of source-mask optimization and freeform illumination for 22 nm node SRAM cells
Date
2011-03
Journal article
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21461.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bekaert, Joost
;
Laenens, Bart
;
Verhaegen, Staf
;
Van Look, Lieve
;
Trivkovic, Darko
;
Lazzarino, Frederic
;
Vandenberghe, Geert
;
Van Adrichem, Paul
;
Socha, Robert
;
Hsu, Stephen
;
Liu, Hua Yu
;
Mouraille, Orion
;
Schreel, Koen
;
Dusa, Mircea
;
Zimmermann, Joerg
;
Gräupner, Paul
;
Neumann, Jens Timo
Journal
Journal of Micro/Nanolithography MEMS and MOEMS
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1
since deposited on 2021-10-19
Acq. date: 2025-10-23
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1956
since deposited on 2021-10-19
Acq. date: 2025-10-23
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Downloads
1
since deposited on 2021-10-19
Acq. date: 2025-10-23
Views
1956
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations