Publication:

Physical origin of current collapse in Au-free AlGaN/GaN Schottky barrier diodes

Date

2014
Journal article
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dc.contributor.authorHu, Jie
dc.contributor.authorStoffels, Steve
dc.contributor.authorLenci, Silvia
dc.contributor.authorRonchi, Nicolo
dc.contributor.authorVenegas, Rafael
dc.contributor.authorYou, Shuzhen
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorLenci, Silvia
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-22T02:07:00Z
dc.date.available2021-10-22T02:07:00Z
dc.date.issued2014
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23963
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0026271414002273
dc.source.beginpage2196
dc.source.endpage2199
dc.source.issue9_10
dc.source.journalMicroelectronics Reliability
dc.source.volume54
dc.title

Physical origin of current collapse in Au-free AlGaN/GaN Schottky barrier diodes

dc.typeJournal article
dspace.entity.typePublication
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