Publication:

Two-dimensional carrier profile characterization for junction engineering in advanced devices

Date

2008
Presentation
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dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.date.accessioned2021-10-17T07:03:58Z
dc.date.available2021-10-17T07:03:58Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13712
dc.source.conferenceESSDERC Tutorial Session on Characterisation for the Nanoelectronics Era
dc.source.conferencedate15/09/2008
dc.source.conferencelocationEdinburgh UK
dc.title

Two-dimensional carrier profile characterization for junction engineering in advanced devices

dc.typeOral presentation
dspace.entity.typePublication
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