Publication:
Minority carrier lifetime improvement in p-type silicon by oxygen related centers gettering at low temperatures: application to the heterojunction solar cell processing
Date
| dc.contributor.author | Ulyashin, A. | |
| dc.contributor.author | Bilyalov, Renat | |
| dc.contributor.author | Bruck, A. | |
| dc.contributor.author | Scherff, M. | |
| dc.contributor.author | Job, R. | |
| dc.contributor.author | Fahrner, W. | |
| dc.contributor.author | Poortmans, Jef | |
| dc.contributor.imecauthor | Poortmans, Jef | |
| dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
| dc.date.accessioned | 2021-10-15T07:04:28Z | |
| dc.date.available | 2021-10-15T07:04:28Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8237 | |
| dc.source.conference | 10th Int. Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology - GADEST | |
| dc.source.conferencedate | 21/09/2003 | |
| dc.source.conferencelocation | Zeuthen Germany | |
| dc.title | Minority carrier lifetime improvement in p-type silicon by oxygen related centers gettering at low temperatures: application to the heterojunction solar cell processing | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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