Publication:

Electrical properties of CuTCNQ based organic memories targeting integration in the CMOS back end-of-line

Date

 
dc.contributor.authorMuller, Robert
dc.contributor.authorBillen, Joris
dc.contributor.authorNaulaerts, Rik
dc.contributor.authorRouault, Olivier
dc.contributor.authorGoux, Ludovic
dc.contributor.authorWouters, Dirk
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.date.accessioned2021-10-16T18:04:34Z
dc.date.available2021-10-16T18:04:34Z
dc.date.issued2007-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12600
dc.source.beginpageI1.10
dc.source.conferenceMaterials and Processes for Nonvolatile Memories II
dc.source.conferencedate9/04/2007
dc.source.conferencelocationSan Francisco, CA USA
dc.title

Electrical properties of CuTCNQ based organic memories targeting integration in the CMOS back end-of-line

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections: