Publication:
Short course FEOL reliability: BTI and TDDB in high k/metal gate, FinFET and Ge-based technologies
Date
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-18T17:27:03Z | |
| dc.date.available | 2021-10-18T17:27:03Z | |
| dc.date.issued | 2010-12 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17334 | |
| dc.source.conference | IEEE International Electron Devices Meeting - IEDM : Short Course | |
| dc.source.conferencedate | 6/12/2010 | |
| dc.source.conferencelocation | San Francisco, CA USA | |
| dc.title | Short course FEOL reliability: BTI and TDDB in high k/metal gate, FinFET and Ge-based technologies | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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