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Radiation hardness aspects of advanced FinFET and UTBOX devices
Publication:
Radiation hardness aspects of advanced FinFET and UTBOX devices
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Date
2012
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Aoulaiche, Marc
;
Simoen, Eddy
;
Griffoni, Alessio
;
Kobayashi, D.
;
Mahatme, N.N.
;
Reed, R.A.
;
Schrimpf, R.D.
;
Agopian, P.G.D.
;
Martino, J.A.
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1941
since deposited on 2021-10-20
Acq. date: 2025-12-11
Citations
Metrics
Views
1941
since deposited on 2021-10-20
Acq. date: 2025-12-11
Citations