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Aanlysing the composition of doped diamond at the atomic level using atom probe tomography

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dc.contributor.authorMartin, T.L.
dc.contributor.authorDrijkoningen, Sien
dc.contributor.authorOthman, M.Z.
dc.contributor.authorBagot, P.A.J.
dc.contributor.authorKoelling, S.
dc.contributor.authorMay, P.W.
dc.contributor.authorHaenen, Ken
dc.contributor.authorMoody, P.
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.date.accessioned2021-10-23T12:35:54Z
dc.date.available2021-10-23T12:35:54Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26972
dc.source.conferenceHasselt Diamond Workshop - SBDD XXI
dc.source.conferencedate9/03/2016
dc.source.conferencelocationHasselt Belgium
dc.title

Aanlysing the composition of doped diamond at the atomic level using atom probe tomography

dc.typeOral presentation
dspace.entity.typePublication
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