Publication:

Structural and electrical investigations of III-(As,Sb) Esaki diodes for BTBT evaluation in TFET devices

Date

2015
Proceedings Paper
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dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorSmets, Quentin
dc.contributor.authorRooyackers, Rita
dc.contributor.authorGeypen, Jef
dc.contributor.authorVerhulst, Anne
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHeyns, Marc
dc.contributor.authorMerckling, Clement
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorGeypen, Jef
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.date.accessioned2021-10-22T19:10:10Z
dc.date.available2021-10-22T19:10:10Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25247
dc.source.beginpageWe1AD6.6
dc.source.conferenceCompound Semiconductor Week 2015
dc.source.conferencedate28/06/2015
dc.source.conferencelocationSanta Barbara, CA USA
dc.title

Structural and electrical investigations of III-(As,Sb) Esaki diodes for BTBT evaluation in TFET devices

dc.typeProceedings paper
dspace.entity.typePublication
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