Publication:

Nitride engineering for improved erase performance and retention of TANOS NAND Flash memory

Date

2008-05
Proceedings Paper
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dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorZahid, Mohammed
dc.contributor.authorDegraeve, Robin
dc.contributor.authorBreuil, Laurent
dc.contributor.authorCacciato, Antonio
dc.contributor.authorRothschild, Aude
dc.contributor.authorOlsen, Chris
dc.contributor.authorGanguly, Udayan
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-17T11:42:00Z
dc.date.available2021-10-17T11:42:00Z
dc.date.issued2008-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14625
dc.source.beginpage128
dc.source.conferenceJoint Non-volatile Semiconductor Memory Workshop / International Conference on Memory Technology and Design
dc.source.conferencedate18/05/2008
dc.source.conferencelocationOpio France
dc.source.endpage129
dc.title

Nitride engineering for improved erase performance and retention of TANOS NAND Flash memory

dc.typeProceedings paper
dspace.entity.typePublication
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