Publication:

Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging

Date

2024-01-20
Journal article
https://doi.org/10.1016/j.aeue.2024.155147
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-2155-8305
cris.virtualsource.department060412a0-f333-4964-b692-f1ab550c24c1
cris.virtualsource.orcid060412a0-f333-4964-b692-f1ab550c24c1
dc.contributor.authorSantana-Andreo, A.
dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorCastro-Lopez, R.
dc.contributor.authorRoca, E.
dc.contributor.authorFernandez, F. V.
dc.contributor.imecauthorSaraza-Canflanca, P.
dc.date.accessioned2024-03-26T17:00:54Z
dc.date.available2024-03-26T17:00:54Z
dc.date.issued2024-01-20
dc.description.wosFundingTextThis work was supported by grant PID2019-103869RB-C31 funded by MCIN/AEI/10.13039/501100011033 and by grant PID2022-136949OB-C21 funded by MCIN/AEI/10.13039/501100011033 and by "ERDF A way of making Europe". Andre's Santana Andreo was supported by grant PRE-2020-093167 funded by MCIN/AEI/10.13039/501100011033 and by "ESF Investing in your future".
dc.identifier.doi10.1016/j.aeue.2024.155147
dc.identifier.issn1434-8411
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43732
dc.publisherELSEVIER GMBH
dc.source.beginpage155147
dc.source.journalAEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS
dc.source.numberofpages12
dc.source.volume176
dc.subject.keywordsSTATE STRESS
dc.subject.keywordsDEGRADATION
dc.subject.keywordsGENERATION
dc.subject.keywordsRELAXATION
dc.subject.keywordsIMPACT
dc.subject.keywordsBTI
dc.title

Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging

dc.typeJournal article
dspace.entity.typePublication
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