Publication:

Two-dimensional carrier profiling with Scanning Capacitance Microscopy, industry-ready innovative research

Date

2003
Proceedings Paper
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dc.contributor.authorDuhayon, Natasja
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorHellemans, L.
dc.contributor.imecauthorDuhayon, Natasja
dc.contributor.imecauthorVandervorst, Wilfried
dc.date.accessioned2021-10-15T04:35:57Z
dc.date.available2021-10-15T04:35:57Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7538
dc.source.conference1st Flanders Engineering PhD Symposium
dc.source.conferencedate11/12/2003
dc.source.conferencelocationBrussel Belgium
dc.title

Two-dimensional carrier profiling with Scanning Capacitance Microscopy, industry-ready innovative research

dc.typeProceedings paper
dspace.entity.typePublication
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