Publication:
Critical discussion on unified 1/f noise models for MOSFETs
Date
| dc.contributor.author | Vandamme, Ewout | |
| dc.contributor.author | Vandamme, Lorenz | |
| dc.date.accessioned | 2021-10-14T14:05:41Z | |
| dc.date.available | 2021-10-14T14:05:41Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4863 | |
| dc.source.beginpage | 2146 | |
| dc.source.endpage | 5152 | |
| dc.source.issue | 11 | |
| dc.source.journal | IEEE Trans. Electron Devices | |
| dc.source.volume | 47 | |
| dc.title | Critical discussion on unified 1/f noise models for MOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |