A consistent model for the hard breakdown distribution including digital soft breakdown: the noble art of area scaling

dc.contributor.author	Roussel, Philippe
dc.contributor.author	Degraeve, Robin
dc.contributor.author	Sahhaf, Sahar
dc.contributor.author	Groeseneken, Guido
dc.contributor.imecauthor	Roussel, Philippe
dc.contributor.imecauthor	Degraeve, Robin
dc.contributor.imecauthor	Sahhaf, Sahar
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.orcidimec	Roussel, Philippe::0000-0002-0402-8225
dc.date.accessioned	2021-10-16T19:14:34Z
dc.date.available	2021-10-16T19:14:34Z
dc.date.issued	2007
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/12815
dc.source.beginpage	1925
dc.source.endpage	1925
dc.source.issue	9_10
dc.source.journal	Microelectronic Engineering
dc.source.volume	84
dc.title	A consistent model for the hard breakdown distribution including digital soft breakdown: the noble art of area scaling
dc.type	Journal article
dspace.entity.type	Publication
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