Publication:
Diode assessment of material characteristics in internally gettered and non-gettered Czochralski silicon: problems, pitfalls and guidelines
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1957 since deposited on 2021-10-01
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Acq. date: 2026-01-25
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1957 since deposited on 2021-10-01
2last month
2last week
Acq. date: 2026-01-25
Citations