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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

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2023-03-23
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dc.contributor.authorMinj, Albert
dc.contributor.authorGeens, Karen
dc.contributor.authorLiang, Hu
dc.contributor.authorHan, Han
dc.contributor.authorNoel, Celine
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorParedis, Kristof
dc.contributor.authorZhao, Ming
dc.contributor.authorHantschel, Thomas
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorMinj, Albert
dc.contributor.imecauthorGeens, Karen
dc.contributor.imecauthorLiang, Hu
dc.contributor.imecauthorHan, Han
dc.contributor.imecauthorNoel, Celine
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecMinj, Albert::0000-0003-0878-3276
dc.contributor.orcidimecGeens, Karen::0000-0003-1815-3972
dc.contributor.orcidimecHan, Han::0000-0003-2169-8332
dc.contributor.orcidimecNoel, Celine::0000-0002-3000-8914
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2023-03-27T13:40:37Z
dc.date.available2023-03-27T13:40:37Z
dc.date.issued2023-03-23
dc.identifier.issn2331-7019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41396
dc.publisherAmerican Physical Society
dc.source.beginpage034081
dc.source.endpage034096
dc.source.issue3
dc.source.journalPhysical Review Applied
dc.source.numberofpages16
dc.source.volume19
dc.subject.disciplinePhysics
dc.subject.keywordsGaN
dc.subject.keywordsscanning capacitance microscopy
dc.subject.keywordsthreading dislocations
dc.subject.keywordsKelvin probe force microscopy
dc.subject.keywordsUNOGAN-896390
dc.title

Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

dc.typeJournal article
dspace.entity.typePublication
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