Publication:
Interface trap characterization of a 5.8-Å EOT p-MOSFET using high frequency on-chip ring oscillator charge pumping technique
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1891 since deposited on 2021-10-19
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Acq. date: 2025-12-15
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1891 since deposited on 2021-10-19
1last month
1last week
Acq. date: 2025-12-15
Citations