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Conference contributions
Real-time monitoring of wet chemial oxidation and etching processes on semiconductor surfaces for process optimization and waste minimization
Publication:
Real-time monitoring of wet chemial oxidation and etching processes on semiconductor surfaces for process optimization and waste minimization
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Date
1996
Meeting abstract
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30233.pdf
69.55 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schmidt, Harald
;
Teerlinck, Ivo
;
Biesemans, Serge
;
Heyns, Marc
Journal
Abstract
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1920
since deposited on 2021-09-29
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Acq. date: 2025-12-15
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Metrics
Views
1920
since deposited on 2021-09-29
2
last month
Acq. date: 2025-12-15
Citations