Publication:

Strong low-frequency noise in buried-channel pMOSFETs under inversion conditions

Date

 
dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M.
dc.contributor.authorGarbar, N.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T12:43:21Z
dc.date.available2021-09-29T12:43:21Z
dc.date.embargo9999-12-31
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/239
dc.source.conference6th Van der Ziel Symposium on Quantum 1/f Noise and Other Low Frequency Fluctuations in Electronic Devices
dc.source.conferencedate27/05/1994
dc.source.conferencelocationSt. Louis, MO USA
dc.title

Strong low-frequency noise in buried-channel pMOSFETs under inversion conditions

dc.typeOral presentation
dspace.entity.typePublication
Files

Original bundle

Name:
231.pdf
Size:
221.91 KB
Format:
Adobe Portable Document Format
Publication available in collections: