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Conference contributions
Advanced metrology for beyond silicon semiconductor device structures
Publication:
Advanced metrology for beyond silicon semiconductor device structures
Date
2015
Proceedings Paper
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31096.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schulze, Andreas
;
Loo, Roger
;
Meersschaut, Johan
;
van Dorp, Dennis
;
Gachet, David
;
Berney, Jean
;
Vandervorst, Wilfried
;
Caymax, Matty
Journal
Abstract
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1877
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1877
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations