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Low frequency noise performance of advanced Si and Ge CMOS technologies

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dc.contributor.authorClaeys, Cor
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-17T21:37:18Z
dc.date.available2021-10-17T21:37:18Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15110
dc.source.beginpage209
dc.source.conference20th International Conference on Noise and Fluctuations - ICNF
dc.source.conferencedate14/06/2009
dc.source.conferencelocationPisa Italy
dc.source.endpage214
dc.title

Low frequency noise performance of advanced Si and Ge CMOS technologies

dc.typeProceedings paper
dspace.entity.typePublication
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