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Thermal crosstalk reduction in IR thermo-electric photodetectors by lock-in method: 4D numerical simulations and experimental verification

Date

2010
Proceedings Paper
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dc.contributor.authorVandermeiren, W.
dc.contributor.authorStiens, J.
dc.contributor.authorDe Tandt, Cathleen
dc.contributor.authorShkerdin, G.
dc.contributor.authorKotov, V.
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorMuys, P.
dc.contributor.authorVounckx, Roger
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorVounckx, Roger
dc.date.accessioned2021-10-18T23:22:14Z
dc.date.available2021-10-18T23:22:14Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18219
dc.source.conferencePhysics and Simulation of Optoelectronic Devices XVIII
dc.source.conferencedate25/01/2010
dc.source.conferencelocationSan Francisco, CA USA
dc.title

Thermal crosstalk reduction in IR thermo-electric photodetectors by lock-in method: 4D numerical simulations and experimental verification

dc.typeProceedings paper
dspace.entity.typePublication
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