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Advanced modeling of oxide defects for random telegraph noise
Publication:
Advanced modeling of oxide defects for random telegraph noise
Date
2011-06
Proceedings Paper
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22346.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Goes, Wolfgang
;
Schanovsky, Franz
;
Grasser, Tibor
;
Reisinger, Hans
;
Kaczer, Ben
Journal
Abstract
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1881
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1881
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations