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Characterization of vertical RESURF diodes using scanning probe microscopy
Publication:
Characterization of vertical RESURF diodes using scanning probe microscopy
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duhayon, Natasja
;
Xu, Mingwei
;
Vandervorst, Wilfried
;
Hellemans, L.
;
Rochefort, Christelle
;
Van Dalen, Rob
Journal
Materials Science and Engineering B
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1968
since deposited on 2021-10-15
3
last month
1
last week
Acq. date: 2025-12-11
Citations
Metrics
Views
1968
since deposited on 2021-10-15
3
last month
1
last week
Acq. date: 2025-12-11
Citations