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Negative bias temperature instabilities in high-k gate dielectrics
Publication:
Negative bias temperature instabilities in high-k gate dielectrics
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Date
2009
Book Chapter
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18159.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Aoulaiche, Marc
;
De Gendt, Stefan
;
Groeseneken, Guido
;
Heyns, Marc
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1873
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Acq. date: 2026-01-11
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Metrics
Views
1873
since deposited on 2021-10-17
1
last month
Acq. date: 2026-01-11
Citations