Publication:

Heavy-ion-induced current transients in bulk and SOI FinFETs

Date

2012
Journal article
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dc.contributor.authorEl-Mamouni, F.
dc.contributor.authorZhang, X.
dc.contributor.authorBall, D.R.
dc.contributor.authorSierawski, B.
dc.contributor.authorKing, M.P.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorReed, R.A.
dc.contributor.authorAlles, M.L.
dc.contributor.authorFleetwood, D.M.
dc.contributor.authorLinten, Dimitri
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVizkelethy, G.
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-20T10:52:56Z
dc.date.available2021-10-20T10:52:56Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20647
dc.source.beginpage2674
dc.source.endpage2681
dc.source.issue6
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.volume59
dc.title

Heavy-ion-induced current transients in bulk and SOI FinFETs

dc.typeJournal article
dspace.entity.typePublication
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