Publication:
Nanometer profiling of carrier distributions within semiconductor devices
Date
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-14T11:50:27Z | |
| dc.date.available | 2021-10-14T11:50:27Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3959 | |
| dc.source.conference | International Conference on Physics of Surfaces and Interfaces; June 1999; Goteborg, Sweden. | |
| dc.source.conferencelocation | ||
| dc.title | Nanometer profiling of carrier distributions within semiconductor devices | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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