Publication:

Bias-dpendant admittance spectroscopy of thin-film solar cells: Experiment and simulation

Date

2020
Journal article
https://doi.org/10.1109/JPHOTOV.2020.2992350
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dc.contributor.authorBrammertz, Guy
dc.contributor.authorKohl, Thierry
dc.contributor.authorde Wild, Jessica
dc.contributor.authorBuldu, Dilara Gokcen
dc.contributor.authorBirant, Gizem
dc.contributor.authorMeuris, Marc
dc.contributor.authorPoortmans, Jef
dc.contributor.authorVermang, Bart
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorKohl, Thierry
dc.contributor.imecauthorde Wild, Jessica
dc.contributor.imecauthorBuldu, Dilara Gokcen
dc.contributor.imecauthorBirant, Gizem
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorVermang, Bart
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecKohl, Thierry::0000-0002-8232-0598
dc.contributor.orcidimecBuldu, Dilara Gokcen::0000-0003-0660-043X
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.contributor.orcidimecVermang, Bart::0000-0003-2669-2087
dc.date.accessioned2021-10-28T20:28:43Z
dc.date.available2021-10-28T20:28:43Z
dc.date.embargo9999-12-31
dc.date.issued2020
dc.identifier.doi10.1109/JPHOTOV.2020.2992350
dc.identifier.issn2156-3381
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34817
dc.source.beginpage1102
dc.source.endpage1111
dc.source.issue4
dc.source.journalIEEE Journal of Photovoltaics
dc.source.volume10
dc.title

Bias-dpendant admittance spectroscopy of thin-film solar cells: Experiment and simulation

dc.typeJournal article
dspace.entity.typePublication
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